Ophis/tests
Michael Martin e5ac21f0f9 Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips.
Reliable technical documentation for how these instructions are decoded is a
little thin on the ground online, so some of this implementation is still
speculative.
2013-01-27 20:18:08 -08:00
..
sub Finish up the test suite 2012-06-12 06:29:03 -07:00
baseinc.bin Finish up the test suite 2012-06-12 06:29:03 -07:00
baseinc.oph Finish up the test suite 2012-06-12 06:29:03 -07:00
branch_c02_ref.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
branch_c02.bin Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
branch_c02.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
longbranch_ref.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
longbranch.bin A new 'correctness optimization': ExtendBranches. 2012-05-27 15:57:23 -07:00
longbranch.oph A new 'correctness optimization': ExtendBranches. 2012-05-27 15:57:23 -07:00
test65c02.bin Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
test65c02.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
test6510.bin Add the NOP Zero Page undocumented opcode. 2012-05-29 18:24:20 -07:00
test6510.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
test_ophis.py Finish up the test suite 2012-06-12 06:29:03 -07:00
testbase.bin Initial import of the Ophis 1.0 distribution and supplemental material 2011-08-20 16:33:25 -07:00
testbase.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
testdata.bin Extend .advance to allow a filler expression. 2012-05-30 20:45:37 -07:00
testdata.oph Extend .advance to allow a filler expression. 2012-05-30 20:45:37 -07:00
testwide.bin Test suite: new tests for basic I/O and binary transforms 2012-06-08 21:50:28 -07:00
testwide.oph Test suite: new tests for basic I/O and binary transforms 2012-06-08 21:50:28 -07:00