Ophis/tests
2014-03-23 16:55:04 +10:30
..
sub Finish up the test suite 2012-06-12 06:29:03 -07:00
baseinc.bin Finish up the test suite 2012-06-12 06:29:03 -07:00
baseinc.oph Finish up the test suite 2012-06-12 06:29:03 -07:00
branch_c02_ref.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
branch_c02.bin Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
branch_c02.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
longbranch_ref.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
longbranch.bin
longbranch.oph
test65c02.bin Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
test65c02.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
test4502.bin remove LF added during conflict resolution. 2014-03-23 16:55:04 +10:30
test4502.oph 4502 instructions INW and DEW are Zero Page, not Absolute 2014-03-23 16:51:01 +10:30
test6510.bin
test6510.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
test_ophis.py Implement test for 4502 extensions. 2014-02-08 02:51:42 +10:30
testbase.bin
testbase.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
testdata.bin
testdata.oph
testwide.bin Test suite: new tests for basic I/O and binary transforms 2012-06-08 21:50:28 -07:00
testwide.oph Test suite: new tests for basic I/O and binary transforms 2012-06-08 21:50:28 -07:00