Michael Martin e5ac21f0f9 Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. ...

Reliable technical documentation for how these instructions are decoded is a
little thin on the ground online, so some of this implementation is still
speculative.

2013-01-27 20:18:08 -08:00

..

sub

Finish up the test suite

2012-06-12 06:29:03 -07:00

baseinc.bin

Finish up the test suite

2012-06-12 06:29:03 -07:00

baseinc.oph

Finish up the test suite

2012-06-12 06:29:03 -07:00

branch_c02_ref.oph

Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips.

2013-01-27 20:18:08 -08:00

branch_c02.bin

Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips.

2013-01-27 20:18:08 -08:00

branch_c02.oph

Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips.

2013-01-27 20:18:08 -08:00

longbranch_ref.oph

Massive code modernization spree.

2012-06-02 00:04:15 -07:00

longbranch.bin

A new 'correctness optimization': ExtendBranches.

2012-05-27 15:57:23 -07:00

longbranch.oph

A new 'correctness optimization': ExtendBranches.

2012-05-27 15:57:23 -07:00

test65c02.bin

Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips.

2013-01-27 20:18:08 -08:00

test65c02.oph

Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips.

2013-01-27 20:18:08 -08:00

test6510.bin

Add the NOP Zero Page undocumented opcode.

2012-05-29 18:24:20 -07:00

test6510.oph

Massive code modernization spree.

2012-06-02 00:04:15 -07:00

test_ophis.py

Finish up the test suite

2012-06-12 06:29:03 -07:00

testbase.bin

Initial import of the Ophis 1.0 distribution and supplemental material

2011-08-20 16:33:25 -07:00

testbase.oph

Massive code modernization spree.

2012-06-02 00:04:15 -07:00

testdata.bin

Extend .advance to allow a filler expression.

2012-05-30 20:45:37 -07:00

testdata.oph

Extend .advance to allow a filler expression.

2012-05-30 20:45:37 -07:00

testwide.bin

Test suite: new tests for basic I/O and binary transforms

2012-06-08 21:50:28 -07:00

testwide.oph

Test suite: new tests for basic I/O and binary transforms

2012-06-08 21:50:28 -07:00