### Legends

Acronym | Brief Description
--- | ---
CLK | Clock
GCK0 | Global Clock 0
GCK1 | Global Clock 1
GCK2 | Global Clock 2
GND | Ground
GSR | Global Set/Reset
GTS0 | Global Output Enable 0
GTS1 | Global Output Enable 1
GTS2 | Global Output Enable 2
GTS3 | Global Output Enable 3
I/O | Input/Output
INIT | Initial state
ISP | In system programmable
JTAG | Joint Test Action Group
KPR | Unused I/O with weak keeper
NC | No Connects
PGND | Programmable ground pin
PROHIBITED | User reserved pin
R | Reset
S | Set
TCK | Test clock
TDI | Test data input
TDO | Test data output
TIE | Unused I/O floating
TMS | Test mode select
LVCMOS | Low Voltage CMOS 3.3 Volts
LVCMOS25 | Low Voltage CMOS 2.5 Volts
LVCMOS33 | Low Voltage CMOS 2.5 to 3.3 Volts
LVTTL | Low Voltage TTL 3.3 Volts
VCCIO | Input/Output Supply Voltage
VCC | Power internal
WPU | Weak Pull Up