From 9333b65cdedefa12a2076fc25592a7b5072726b7 Mon Sep 17 00:00:00 2001 From: Doug Brown Date: Sun, 18 Dec 2011 12:00:22 -0800 Subject: [PATCH] Fixed a tiny mistake -- forgot to say the name of one of my enums after the typedef. Finished making the electrical test work -- I had failed to realize that I have to ignore the ground shorts once they have been found -- otherwise they reappear against EVERY tested pin (because they are always low and I'm testing for low pins -- duh!). Anyway, it was showing way too many shorts, and that's why. Now I independently can find shorts between separate pins without getting flooded with the ground shorts too. Only thing that's missing is the VCC shorts, but I can't do that without pullups (to my knowledge) --- tests/simm_electrical_test.c | 77 +++++++++++++++++++++++++++++++----- usb_serial/usb_serial.c | 2 +- 2 files changed, 68 insertions(+), 11 deletions(-) diff --git a/tests/simm_electrical_test.c b/tests/simm_electrical_test.c index b563bf6..605ee66 100644 --- a/tests/simm_electrical_test.c +++ b/tests/simm_electrical_test.c @@ -27,14 +27,20 @@ typedef enum ElectricalTestStage DoneTesting } ElectricalTestStage; -// TODO: Remember which lines shorted to ground and don't repeat those errors as being -// shorted to each other? +// Private functions +void SIMMElectricalTest_ResetGroundShorts(void); +void SIMMElectricalTest_AddGroundShort(uint8_t index); +bool SIMMElectricalTest_IsGroundShort(uint8_t index); int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) { // Returns number of errors found int numErrors = 0; + // Pins we have determined are shorted to ground + // (We have to ignore them during the second phase of the test) + SIMMElectricalTest_ResetGroundShorts(); + Ports_Init(); DelayMS(DELAY_SETTLE_TIME_MS); @@ -71,6 +77,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) if (readback & 1) // failure here? { errorHandler(failIndex, GROUND_FAIL_INDEX); + SIMMElectricalTest_AddGroundShort(failIndex); numErrors++; } @@ -91,6 +98,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) if (readback & 1) // failure here? { errorHandler(failIndex, GROUND_FAIL_INDEX); + SIMMElectricalTest_AddGroundShort(failIndex); numErrors++; } @@ -102,21 +110,28 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) if (!Ports_ReadCS()) { errorHandler(CS_FAIL_INDEX, GROUND_FAIL_INDEX); + SIMMElectricalTest_AddGroundShort(CS_FAIL_INDEX); numErrors++; } if (!Ports_ReadOE()) { errorHandler(OE_FAIL_INDEX, GROUND_FAIL_INDEX); + SIMMElectricalTest_AddGroundShort(OE_FAIL_INDEX); numErrors++; } if (!Ports_ReadWE()) { errorHandler(WE_FAIL_INDEX, GROUND_FAIL_INDEX); + SIMMElectricalTest_AddGroundShort(WE_FAIL_INDEX); numErrors++; } + // OK, now we know which lines are shorted to ground. + // We need to keep that in mind, because those lines will now show as shorted + // to ALL other lines...ignore them during tests to find other independent shorts + // Now, check each individual line vs. all other lines on the SIMM for any shorts between them ElectricalTestStage curStage = TestingAddressLines; int x = 0; @@ -128,7 +143,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) // it means they are shorted to the pin we set as an output. // This is the fail index of the pin we are outputting a 0 on. - testPinFailIndex = 0; + testPinFailIndex = 0xFE; // Start with a default invalid value...will be replaced though. if (curStage == TestingAddressLines) { @@ -137,7 +152,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) Ports_SetAddressDDR(addressLineMask); // set it as an output and all other address pins as inputs Ports_AddressOut_RMW(0, addressLineMask); // set the output pin to output "0" without affecting the input pins - Ports_AddressPullups_RMW(~addressLineMask, SIMM_ADDRESS_PINS_MASK); // turn on the pullups on all input pins + Ports_AddressPullups_RMW(SIMM_ADDRESS_PINS_MASK, ~addressLineMask); // turn on the pullups on all input pins } else { @@ -154,7 +169,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) uint32_t dataLineMask = (1UL << x); Ports_SetDataDDR(dataLineMask); Ports_DataOut_RMW(0, dataLineMask); - Ports_DataPullups_RMW(~dataLineMask, SIMM_DATA_PINS_MASK); + Ports_DataPullups_RMW(SIMM_DATA_PINS_MASK, ~dataLineMask); } else { @@ -220,7 +235,8 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) // Count any shorted pins while (readback) { - if (readback & 1) // failure here? + // failure here? + if ((readback & 1) && !SIMMElectricalTest_IsGroundShort(failIndex)) { errorHandler(testPinFailIndex, failIndex); numErrors++; @@ -245,7 +261,8 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) // Count any shorted pins while (readback) { - if (readback & 1) // failure here? + // failure here? + if ((readback & 1) && !SIMMElectricalTest_IsGroundShort(failIndex)) { errorHandler(testPinFailIndex, failIndex); numErrors++; @@ -257,7 +274,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) if (curStage != TestingCS) { - if (!Ports_ReadCS()) + if (!Ports_ReadCS() && !SIMMElectricalTest_IsGroundShort(CS_FAIL_INDEX)) { errorHandler(testPinFailIndex, CS_FAIL_INDEX); numErrors++; @@ -266,7 +283,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) if (curStage != TestingOE) { - if (!Ports_ReadOE()) + if (!Ports_ReadOE() && !SIMMElectricalTest_IsGroundShort(OE_FAIL_INDEX)) { errorHandler(testPinFailIndex, OE_FAIL_INDEX); numErrors++; @@ -275,7 +292,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) if (curStage != TestingWE) { - if (!Ports_ReadWE()) + if (!Ports_ReadWE() && !SIMMElectricalTest_IsGroundShort(WE_FAIL_INDEX)) { errorHandler(testPinFailIndex, WE_FAIL_INDEX); numErrors++; @@ -310,3 +327,43 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t)) return numErrors; } + +// Stuff for handling shorts to ground +// (They have to be remembered because the ground shorts will be repeated +// when you test each individual pin against all other pins) +static uint32_t groundShorts[2]; + +void SIMMElectricalTest_ResetGroundShorts(void) +{ + groundShorts[0] = 0; + groundShorts[1] = 0; +} + +void SIMMElectricalTest_AddGroundShort(uint8_t index) +{ + if (index < 32) + { + groundShorts[0] |= (1UL << index); + } + else if (index < 64) + { + groundShorts[1] |= (1UL << (index - 32)); + } + // None are >= 64, no further handling needed +} + +bool SIMMElectricalTest_IsGroundShort(uint8_t index) +{ + if (index < 32) + { + return ((groundShorts[0] & (1UL << index)) != 0); + } + else if (index < 64) + { + return ((groundShorts[1] & (1UL << (index - 32))) != 0); + } + else + { + return false; + } +} diff --git a/usb_serial/usb_serial.c b/usb_serial/usb_serial.c index 1f6d317..a050694 100644 --- a/usb_serial/usb_serial.c +++ b/usb_serial/usb_serial.c @@ -111,7 +111,7 @@ typedef enum ProgrammerElectricalTestReply { ProgrammerElectricalTestFail, ProgrammerElectricalTestDone -}; +} ProgrammerElectricalTestReply; static ProgrammerCommandState curCommandState = WaitingForCommand; static uint8_t byteAddressReceiveCount = 0;