Ophis/tests
gardners dcc37f5751 Implement test for 4502 extensions.
Fix numerous bugs revealed through tests, some more remain.
2014-02-08 02:51:42 +10:30
..
sub Finish up the test suite 2012-06-12 06:29:03 -07:00
baseinc.bin Finish up the test suite 2012-06-12 06:29:03 -07:00
baseinc.oph Finish up the test suite 2012-06-12 06:29:03 -07:00
branch_c02_ref.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
branch_c02.bin Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
branch_c02.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
longbranch_ref.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
longbranch.bin
longbranch.oph
test65c02.bin Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
test65c02.oph Second attempt at implementation of the BBXn instructions for Rockwell 65c02 chips. 2013-01-27 20:18:08 -08:00
test4502.oph Implement test for 4502 extensions. 2014-02-08 02:51:42 +10:30
test6510.bin Add the NOP Zero Page undocumented opcode. 2012-05-29 18:24:20 -07:00
test6510.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
test_ophis.py Implement test for 4502 extensions. 2014-02-08 02:51:42 +10:30
testbase.bin
testbase.oph Massive code modernization spree. 2012-06-02 00:04:15 -07:00
testdata.bin Extend .advance to allow a filler expression. 2012-05-30 20:45:37 -07:00
testdata.oph Extend .advance to allow a filler expression. 2012-05-30 20:45:37 -07:00
testwide.bin Test suite: new tests for basic I/O and binary transforms 2012-06-08 21:50:28 -07:00
testwide.oph Test suite: new tests for basic I/O and binary transforms 2012-06-08 21:50:28 -07:00