Upgrade to use new Tcl exec based test harness. This exposes 3 bugs that
were previously not being reported:
test/Transforms/GlobalDCE/2002-08-17-FunctionDGE.ll
test/Transforms/GlobalOpt/memset.ll
test/Transforms/IndVarsSimplify/exit_value_tests.llx
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@36065 91177308-0d34-0410-b5e6-96231b3b80d8
This feature is needed in order to support shifts of more than 255 bits
on large integer types. This changes the syntax for llvm assembly to
make shl, ashr and lshr instructions look like a binary operator:
shl i32 %X, 1
instead of
shl i32 %X, i8 1
Additionally, this should help a few passes perform additional optimizations.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@33776 91177308-0d34-0410-b5e6-96231b3b80d8
Update the test suite to accommodate the change from signed integer types
to signless integer types. The changes were of only a few kinds:
1. Make sure llvm-upgrade is run on the source which does the bulk of the
changes automatically.
2. Change things like "grep 'int'" to "grep 'i32'"
3. In several tests bitcasting caused the same name to be reused in the
same type plane. These had to be manually fixed. The fix was (generally)
to leave the bitcast and provide the instruction with a new name. This
should not affect the semantics of the test. In a few cases, the
bitcasts were known to be superfluous and irrelevant to the test case
so they were removed.
4. One test case uses a bytecode file which needed to be updated to the
latest bytecode format.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@32789 91177308-0d34-0410-b5e6-96231b3b80d8
