EH info for these functions causes the tests to fail for
random reasons (e.g. looking for 'or' or counting lines
with asm-printer; labels count as lines.)
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@49003 91177308-0d34-0410-b5e6-96231b3b80d8
Update the test suite to accommodate the change from signed integer types
to signless integer types. The changes were of only a few kinds:
1. Make sure llvm-upgrade is run on the source which does the bulk of the
changes automatically.
2. Change things like "grep 'int'" to "grep 'i32'"
3. In several tests bitcasting caused the same name to be reused in the
same type plane. These had to be manually fixed. The fix was (generally)
to leave the bitcast and provide the instruction with a new name. This
should not affect the semantics of the test. In a few cases, the
bitcasts were known to be superfluous and irrelevant to the test case
so they were removed.
4. One test case uses a bytecode file which needed to be updated to the
latest bytecode format.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@32789 91177308-0d34-0410-b5e6-96231b3b80d8
