This was done with the following sed invocation to catch label lines demarking function boundaries:
sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll
which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@186258 91177308-0d34-0410-b5e6-96231b3b80d8
This patch will generate the following for integer ABS:
movl %edi, %eax
negl %eax
cmovll %edi, %eax
INSTEAD OF
movl %edi, %ecx
sarl $31, %ecx
leal (%rdi,%rcx), %eax
xorl %ecx, %eax
There exists a target-independent DAG combine for integer ABS, which converts
integer ABS to sar+add+xor. For X86, we match this pattern back to neg+cmov.
This is implemented in PerformXorCombine.
rdar://10695237
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@158175 91177308-0d34-0410-b5e6-96231b3b80d8
EH info for these functions causes the tests to fail for
random reasons (e.g. looking for 'or' or counting lines
with asm-printer; labels count as lines.)
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@49003 91177308-0d34-0410-b5e6-96231b3b80d8
