llvm-6502/test/Analysis/ScalarEvolution/trip-count.ll
2010-01-26 19:25:59 +00:00

30 lines
910 B
LLVM

; RUN: opt < %s -analyze -scalar-evolution \
; RUN: -scalar-evolution-max-iterations=0 | grep {backedge-taken count is 10000}
; PR1101
@A = weak global [1000 x i32] zeroinitializer, align 32
define void @test(i32 %N) {
entry:
"alloca point" = bitcast i32 0 to i32 ; <i32> [#uses=0]
br label %bb3
bb: ; preds = %bb3
%tmp = getelementptr [1000 x i32]* @A, i32 0, i32 %i.0 ; <i32*> [#uses=1]
store i32 123, i32* %tmp
%tmp2 = add i32 %i.0, 1 ; <i32> [#uses=1]
br label %bb3
bb3: ; preds = %bb, %entry
%i.0 = phi i32 [ 0, %entry ], [ %tmp2, %bb ] ; <i32> [#uses=3]
%tmp3 = icmp sle i32 %i.0, 9999 ; <i1> [#uses=1]
br i1 %tmp3, label %bb, label %bb5
bb5: ; preds = %bb3
br label %return
return: ; preds = %bb5
ret void
}