llvm-6502/test/Transforms/SCCP/apint-ipsccp1.ll
Reid Spencer 9aafdcf20d For PR1319:
Upgrade to use new Tcl exec based test harness. This exposes 3 bugs that
were previously not being reported:
test/Transforms/GlobalDCE/2002-08-17-FunctionDGE.ll
test/Transforms/GlobalOpt/memset.ll
test/Transforms/IndVarsSimplify/exit_value_tests.llx


git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@36065 91177308-0d34-0410-b5e6-96231b3b80d8
2007-04-15 09:21:47 +00:00

25 lines
456 B
LLVM

; RUN: llvm-as < %s | opt -ipsccp | llvm-dis | grep -v {ret i512 undef} | \
; RUN: grep {ret i8 2}
define internal i512 @test(i1 %B) {
br i1 %B, label %BB1, label %BB2
BB1:
%Val = add i512 0, 1
br label %BB3
BB2:
br label %BB3
BB3:
%Ret = phi i512 [%Val, %BB1], [2, %BB2]
ret i512 %Ret
}
define i8 @caller()
{
%t1 = and i2 2, 1
%t11 = trunc i2 %t1 to i1
%t2 = call i512 @test(i1 %t11)
%t3 = trunc i512 %t2 to i8
ret i8 %t3
}