llvm-6502/test/CodeGen/AArch64/inline-asm-constraints-badK.ll
Stephen Lin b4dc0233c9 Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion.
This was done with the following sed invocation to catch label lines demarking function boundaries:
    sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll
which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct.


git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@186258 91177308-0d34-0410-b5e6-96231b3b80d8
2013-07-13 20:38:47 +00:00

8 lines
200 B
LLVM

; RUN: not llc -mtriple=aarch64-none-linux-gnu < %s
define void @foo() {
; 32-bit bitpattern ending in 1101 can't be produced.
call void asm sideeffect "and w0, w0, $0", "K"(i32 13)
ret void
}