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9aafdcf20d
Upgrade to use new Tcl exec based test harness. This exposes 3 bugs that were previously not being reported: test/Transforms/GlobalDCE/2002-08-17-FunctionDGE.ll test/Transforms/GlobalOpt/memset.ll test/Transforms/IndVarsSimplify/exit_value_tests.llx git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@36065 91177308-0d34-0410-b5e6-96231b3b80d8
48 lines
998 B
LLVM
48 lines
998 B
LLVM
; RUN: llvm-upgrade < %s | llvm-as | opt -simplifycfg | llvm-dis | \
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; RUN: grep switch | wc -l | grep 1
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; Test that a switch going to a switch on the same value can be merged. All
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; three switches in this example can be merged into one big one.
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declare void %foo1()
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declare void %foo2()
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declare void %foo3()
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declare void %foo4()
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void %test1(uint %V) {
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switch uint %V, label %F [
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uint 4, label %T
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uint 17, label %T
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uint 5, label %T
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uint 1234, label %F
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]
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T:
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switch uint %V, label %F [
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uint 4, label %A
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uint 17, label %B
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uint 42, label %C
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]
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A:
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call void %foo1()
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ret void
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B:
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call void %foo2()
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ret void
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C:
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call void %foo3()
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ret void
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F:
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switch uint %V, label %F [
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uint 4, label %B
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uint 18, label %B
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uint 42, label %D
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]
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D:
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call void %foo4()
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ret void
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}
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