llvm-6502/test/CodeGen/ARM/dagcombine-concatvector.ll
Stephen Lin b4dc0233c9 Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion.
This was done with the following sed invocation to catch label lines demarking function boundaries:
    sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll
which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct.


git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@186258 91177308-0d34-0410-b5e6-96231b3b80d8
2013-07-13 20:38:47 +00:00

24 lines
1.3 KiB
LLVM

; RUN: llc < %s -mtriple=thumbv7s-apple-ios3.0.0 | FileCheck %s
; PR15525
; CHECK-LABEL: test1:
; CHECK: ldr.w [[REG:r[0-9]+]], [sp]
; CHECK-NEXT: vmov {{d[0-9]+}}, r1, r2
; CHECK-NEXT: vmov {{d[0-9]+}}, r3, [[REG]]
; CHECK-NEXT: vst1.8 {{{d[0-9]+}}, {{d[0-9]+}}}, [r0]
; CHECK-NEXT: bx lr
define void @test1(i8* %arg, [4 x i64] %vec.coerce) {
bb:
%tmp = extractvalue [4 x i64] %vec.coerce, 0
%tmp2 = bitcast i64 %tmp to <8 x i8>
%tmp3 = shufflevector <8 x i8> %tmp2, <8 x i8> undef, <16 x i32> <i32 0, i32 1, i32 2, i32 3, i32 4, i32 5, i32 6, i32 7, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef>
%tmp4 = extractvalue [4 x i64] %vec.coerce, 1
%tmp5 = bitcast i64 %tmp4 to <8 x i8>
%tmp6 = shufflevector <8 x i8> %tmp5, <8 x i8> undef, <16 x i32> <i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 undef, i32 0, i32 1, i32 2, i32 3, i32 4, i32 5, i32 6, i32 7>
%tmp7 = shufflevector <16 x i8> %tmp6, <16 x i8> %tmp3, <16 x i32> <i32 16, i32 17, i32 18, i32 19, i32 20, i32 21, i32 22, i32 23, i32 8, i32 9, i32 10, i32 11, i32 12, i32 13, i32 14, i32 15>
tail call void @llvm.arm.neon.vst1.v16i8(i8* %arg, <16 x i8> %tmp7, i32 2)
ret void
}
declare void @llvm.arm.neon.vst1.v16i8(i8*, <16 x i8>, i32)