Soft-switched for either RAMRD or RAMWRT read as set, which means we're either reading from, or writing to, auxiliary RAM. Please press RESET and run the test again to start in a known-good state.
This is a data-driven test of Language Card operation. We initialize $D17B in RAM bank 1 to $11, $D17B in RAM bank 2 to $22, and $FE1F in RAM to $33. Then, we perform a testdata-driven sequence of LDA and STA to the $C08X range. Finally we (try to) increment $D17B and $FE1F. Then we test (a) the current live value in $D17B, (b) the current live value in $FE1F, (c) the RAM bank 1 value of $D17B, (d) the RAM bank 2 value of $D17B, and (e) the RAM value of $FE1F, to see whether they match expected values. $D17B is usually $53 in ROM, and $FE1F is usally $60. For more information on the operation of the language card soft-switches, see Understanding the Apple IIe, by James Fielding Sather, Pg 5-24.
We tried to run the langcard tests again with auxmem (ALTZP active), and they failed, so we're quitting the auxmem test.
## E0009
We wrote $44 to main RAM in the three test locations used by the LC test. They should have been unaffected by the LC test while it was using auxmem, but at least one of them was modified.
This is a data-driven test of main and auxiliary memory softswitch operation. We initialize $FF, $100, $200, $3FF, $427, $7FF, $800, $1FFF, $2000, $3FFF, $4000, $5FFF, and $BFFF in main RAM to value 1, and in auxiliary RAM to value 3. Then, we perform a testdata-driven sequence of instructions. Finally we (try to) increment all test locations. Then we test the expected values of the test locations in main and auxiliary memory. For more information on the operation of the auxiliary memory soft-switches, see Understanding the Apple IIe, by James Fielding Sather, Pg 5-22 to 5-28.