| Acronym | Verbose Description |
|---|---|
| * | User Assigned |
| (b) | Buried macrocell |
| FB# | Function Block number |
| GCK# | Global Clock number |
| GTS# | Global Output Enable number |
| GSR | Global Set/Reset |
| I | Input |
| I/O | Input/Output |
| Latch | Transparent latch |
| LOW | Low Power Mode |
| MC# | Macrocell number |
| O | Output |
| OD | Open Drain |
| PU | Pullup |
| /S | After any flop/latch type indicates initial state is Set |
| STD | Standard Power Mode |
| TCK | One of four terminals required by (JTAG) IEEE Std 1149 or IEEE Std 1532. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pull-up forces TCK to a high level if left unconnected. |
| TDI | One of four terminals required by (JTAG) IEEE Std 1149 or IEEE Std 1532. It is the serial input for shifting data through the instruction register or selected data register. An internal pull-up forces TDI to a high level if left unconnected. |
| TDO | One of four terminals required by (JTAG) IEEE Std 1149 or IEEE Std 1532. It is the serial output for shifting data through the instruction register or selected data register. An internal pull-up forces TDI to a high level when it is not driven from an external source. |
| TFF | Toggle Flip-Flop |
| TMS | One of four terminals required by (JTAG) IEEE Std 1149 or IEEE Std 1532. It directs the device through its Test Access Port controller states. An internal pull-up forces TDI to a high level when it is not driven from an external source. TMS also provides the optional test reset signal of IEEE Std 1149 or IEEE Std 1532. |