2023-05-28 17:55:09 +00:00
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/*
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* simm_electrical_test.c
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*
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* Created on: Nov 26, 2011
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* Author: Doug
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*
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* Copyright (C) 2011-2020 Doug Brown
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*
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* This program is free software; you can redistribute it and/or
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* modify it under the terms of the GNU General Public License
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* as published by the Free Software Foundation; either version 2
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* of the License, or (at your option) any later version.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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* You should have received a copy of the GNU General Public License
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* along with this program; if not, write to the Free Software
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* Foundation, Inc., 51 Franklin Street, Fifth Floor, Boston, MA 02110-1301, USA.
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*
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*/
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#include "simm_electrical_test.h"
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#include "../hal/parallel_bus.h"
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#include "hardware.h"
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/// The index of the highest SIMM address pin
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#define SIMM_HIGHEST_ADDRESS_LINE 20
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/// Mask that represents every SIMM address pin
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#define SIMM_ADDRESS_PINS_MASK ((1UL << (SIMM_HIGHEST_ADDRESS_LINE + 1)) - 1)
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/// The index of the highest SIMM data pin
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#define SIMM_HIGHEST_DATA_LINE 31
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/// Mask that represents every SIMM data pin
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#define SIMM_DATA_PINS_MASK 0xFFFFFFFFUL
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/// Milliseconds to wait before testing for shorts
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#define DELAY_SETTLE_TIME_MS 20
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/// The index reported as a short when it's a ground short
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#define GROUND_FAIL_INDEX 0xFF
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/// The index reported when A0 is shorted
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#define FIRST_ADDRESS_LINE_FAIL_INDEX 0
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/// The index reported when A20 is shorted
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#define LAST_ADDRESS_LINE_FAIL_INDEX (FIRST_ADDRESS_LINE_FAIL_INDEX + SIMM_HIGHEST_ADDRESS_LINE)
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/// The index reported when D0 is shorted
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#define FIRST_DATA_LINE_FAIL_INDEX (LAST_ADDRESS_LINE_FAIL_INDEX + 1)
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/// The index reported when D31 is shorted
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#define LAST_DATA_LINE_FAIL_INDEX (FIRST_DATA_LINE_FAIL_INDEX + SIMM_HIGHEST_DATA_LINE)
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/// The index reported when CS is shorted
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#define CS_FAIL_INDEX (LAST_DATA_LINE_FAIL_INDEX + 1)
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/// The index reported when OE is shorted
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#define OE_FAIL_INDEX (CS_FAIL_INDEX + 1)
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/// The index reported when WE is shorted
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#define WE_FAIL_INDEX (OE_FAIL_INDEX + 1)
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/// Enum representing the step we're on during the electrical test
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typedef enum ElectricalTestStage
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{
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TestingAddressLines,//!< We are testing an address pin
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TestingDataLines, //!< We are testing a data pin
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TestingCS, //!< We are testing the CS pin
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TestingOE, //!< We are testing the OE pin
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TestingWE, //!< We are testing the WE pin
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DoneTesting //!< We completed the test
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} ElectricalTestStage;
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static void SIMMElectricalTest_ResetGroundShorts(void);
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static void SIMMElectricalTest_AddGroundShort(uint8_t index);
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static bool SIMMElectricalTest_IsGroundShort(uint8_t index);
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/// Pin indexes that were detected as shorted to ground. They have to be saved,
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/// because they end up being detected as a short against every other pin,
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/// so we have to be able to filter them out when testing non-ground shorts.
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static uint32_t groundShorts[2];
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/** Runs the electrical test
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*
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* @param errorHandler Pointer to function to call when a short is detected.
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* @return The number of errors we found
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*
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* The two parameters to errorHandler are the two indexes that are shorted.
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* (See the _FAIL_INDEX defines at the top of this file)
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*/
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int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
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{
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// Returns number of errors found
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int numErrors = 0;
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// Reset the pins we have determined that are shorted to ground
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// (We have to ignore them during the second phase of the test)
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SIMMElectricalTest_ResetGroundShorts();
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// First check for anything shorted to ground. Set all lines as inputs with
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// a weak pull-up resistor. Then read the values back and check for any
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// zeros. This would indicate a short to ground.
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ParallelBus_SetAddressDir(0);
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ParallelBus_SetDataDir(0);
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ParallelBus_SetCSDir(false);
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ParallelBus_SetOEDir(false);
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ParallelBus_SetWEDir(false);
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ParallelBus_SetAddressPullups(SIMM_ADDRESS_PINS_MASK);
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ParallelBus_SetDataPullups(SIMM_DATA_PINS_MASK);
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ParallelBus_SetCSPullup(true);
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ParallelBus_SetOEPullup(true);
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ParallelBus_SetWEPullup(true);
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// Wait a brief moment...
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DelayMS(DELAY_SETTLE_TIME_MS);
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// Now loop through every pin and check it.
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uint8_t curPin = 0;
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uint8_t i;
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// Read the address pins back first
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uint32_t readback = ParallelBus_ReadAddress();
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// Check each bit for a LOW which would indicate a short to ground
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for (i = 0; i <= SIMM_HIGHEST_ADDRESS_LINE; i++)
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{
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// Did we find a low bit?
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if (!(readback & 1))
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{
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// That means this pin is shorted to ground.
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// So notify the caller that we have a ground short on this pin
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if (errorHandler)
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{
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errorHandler(curPin, GROUND_FAIL_INDEX);
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}
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// Add it to our internal list of ground shorts also.
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SIMMElectricalTest_AddGroundShort(curPin);
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// And of course increment the error counter.
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numErrors++;
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}
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// No matter what, though, move on to the next bit and pin.
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readback >>= 1;
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curPin++;
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}
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// Repeat the exact same process for the data pins
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readback = ParallelBus_ReadData();
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for (i = 0; i <= SIMM_HIGHEST_DATA_LINE; i++)
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{
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if (!(readback & 1))
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{
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if (errorHandler)
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{
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errorHandler(curPin, GROUND_FAIL_INDEX);
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}
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SIMMElectricalTest_AddGroundShort(curPin);
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numErrors++;
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}
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readback >>= 1;
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curPin++;
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}
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// Check chip select in the same way...
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if (!ParallelBus_ReadCS())
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{
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if (errorHandler)
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{
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errorHandler(curPin, GROUND_FAIL_INDEX);
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}
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SIMMElectricalTest_AddGroundShort(curPin);
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numErrors++;
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}
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curPin++;
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// Output enable...
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if (!ParallelBus_ReadOE())
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{
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if (errorHandler)
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{
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errorHandler(curPin, GROUND_FAIL_INDEX);
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}
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SIMMElectricalTest_AddGroundShort(curPin);
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numErrors++;
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}
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curPin++;
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// Write enable...
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if (!ParallelBus_ReadWE())
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{
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if (errorHandler)
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{
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errorHandler(curPin, GROUND_FAIL_INDEX);
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}
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SIMMElectricalTest_AddGroundShort(curPin);
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numErrors++;
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}
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curPin++; // Doesn't need to be here, but for consistency I'm leaving it.
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// OK, now we know which lines are shorted to ground. We need to keep that
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// in mind, because those lines will now show as shorted to ALL other
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// lines...ignore them during tests to find other independent shorts
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// Now, check each individual line vs. all other lines on the SIMM for any
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// shorts between them
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ElectricalTestStage curStage = TestingAddressLines;
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// Counter of what address or data pin we're on. Not used for control lines.
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uint8_t addrDataPin = 0;
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// What pin we are currently testing all other pins against.
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uint8_t testPin = 0;
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// More explanation: addrDataPin is only a counter inside the address or
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// data pins. testPin is a total counter of ALL pins.
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while (curStage != DoneTesting)
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{
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// Set one pin to output a 0.
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// Set all other pins as inputs with pull-ups.
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// Then read back all the other pins. If any of them read back as 0,
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// it means they are shorted to the pin we set as an output.
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// If we're testing address lines right now, set the current address
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// line as an output (and make it output a LOW). Set all other address
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// lines as inputs with pullups.
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if (curStage == TestingAddressLines)
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{
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// Mask of the address pin we're testing
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uint32_t addressLineMask = (1UL << addrDataPin);
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// Set it as an output and all other address pins as inputs.
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ParallelBus_SetAddressDir(addressLineMask);
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ParallelBus_SetAddress(0);
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ParallelBus_SetAddressPullups(~addressLineMask);
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}
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else
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{
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// If not testing an address line, set all address pins as inputs
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// with pullups. All the other stages follow the same pattern so I
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// won't bother commenting them.
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ParallelBus_SetAddressDir(0);
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ParallelBus_SetAddressPullups(SIMM_ADDRESS_PINS_MASK);
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}
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// Do the same thing for data lines...
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if (curStage == TestingDataLines)
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{
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uint32_t dataLineMask = (1UL << addrDataPin);
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ParallelBus_SetDataDir(dataLineMask);
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ParallelBus_SetData(0);
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ParallelBus_SetDataPullups(~dataLineMask);
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}
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else
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{
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ParallelBus_SetDataDir(0);
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ParallelBus_SetDataPullups(SIMM_DATA_PINS_MASK);
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}
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// Chip select...
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if (curStage == TestingCS)
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{
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ParallelBus_SetCSDir(true);
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ParallelBus_SetCS(false);
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}
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else
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{
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ParallelBus_SetCSDir(false);
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ParallelBus_SetCSPullup(true);
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}
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// Output enable...
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if (curStage == TestingOE)
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{
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ParallelBus_SetOEDir(true);
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ParallelBus_SetOE(false);
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}
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else
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{
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ParallelBus_SetOEDir(false);
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ParallelBus_SetOEPullup(true);
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}
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// And write enable.
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if (curStage == TestingWE)
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{
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ParallelBus_SetWEDir(true);
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ParallelBus_SetWE(false);
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}
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else
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{
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ParallelBus_SetWEDir(false);
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ParallelBus_SetWEPullup(true);
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}
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// OK, so now we have set up all lines as needed. Exactly one pin is
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// outputting a 0, and all other pins are inputs with pull-ups enabled.
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// Read back all the lines, and if any pin reads back as 0, it means
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// that pin is shorted to the pin we are testing (overpowering its
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// pullup). However, because we test each pin against every other pin,
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// any short would appear twice. Once as "pin 1 is shorted to pin 2"
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// and once as "pin 2 is shorted to pin 1". To avoid that annoyance, I
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// only check each combination of two pins once. You'll see below how I
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// do this by testing to ensure curPin > testPin.
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// Allow everything to settle
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DelayMS(DELAY_SETTLE_TIME_MS);
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// Now keep a count of how many pins we have actually checked during
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// THIS test iteration. This is the "fail index" of the current pin.
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curPin = 0;
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// Read back the address data to see if any shorts were found
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readback = ParallelBus_ReadAddress();
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// Count any shorted pins
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for (i = 0; i <= SIMM_HIGHEST_ADDRESS_LINE; i++)
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{
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// Failure here?
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if ((curPin > testPin) && // We haven't already checked this combination of pins (don't test pin against itself either)
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!(readback & 1) && // It's showing as low (which indicates a short)
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!SIMMElectricalTest_IsGroundShort(curPin)) // And it's not recorded as a short to ground
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{
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// Send it out as an error notification and increase error counter
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if (errorHandler)
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{
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errorHandler(testPin, curPin);
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}
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numErrors++;
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}
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// No matter what, move on to the next bit and pin
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readback >>= 1;
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curPin++;
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}
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// Same thing for data pins
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readback = ParallelBus_ReadData();
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// Count any shorted pins
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for (i = 0; i <= SIMM_HIGHEST_DATA_LINE; i++)
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{
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// Failure here?
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if ((curPin > testPin) && // We haven't already checked this combination of pins (don't test pin against itself either)
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!(readback & 1) && // It's showing as low (which indicates a short)
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!SIMMElectricalTest_IsGroundShort(curPin)) // And it's not recorded as a short to ground
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{
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if (errorHandler)
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{
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errorHandler(testPin, curPin);
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}
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numErrors++;
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}
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readback >>= 1;
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curPin++;
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}
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// And chip select...
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if ((curPin > testPin) &&
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!ParallelBus_ReadCS() &&
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!SIMMElectricalTest_IsGroundShort(curPin))
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{
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if (errorHandler)
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{
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errorHandler(testPin, curPin);
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}
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numErrors++;
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}
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curPin++;
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// Output enable...
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if ((curPin > testPin) &&
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!ParallelBus_ReadOE() &&
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!SIMMElectricalTest_IsGroundShort(curPin))
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{
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if (errorHandler)
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{
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errorHandler(testPin, curPin);
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}
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numErrors++;
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|
|
|
}
|
|
|
|
curPin++;
|
|
|
|
|
|
|
|
// And write enable
|
|
|
|
if ((curPin > testPin) &&
|
|
|
|
!ParallelBus_ReadWE() &&
|
|
|
|
!SIMMElectricalTest_IsGroundShort(curPin))
|
|
|
|
{
|
|
|
|
if (errorHandler)
|
|
|
|
{
|
|
|
|
errorHandler(testPin, curPin);
|
|
|
|
}
|
|
|
|
numErrors++;
|
|
|
|
}
|
|
|
|
curPin++; // Not needed, kept for consistency
|
|
|
|
|
|
|
|
// Finally, move on to the next stage if needed.
|
|
|
|
if (curStage == TestingAddressLines)
|
|
|
|
{
|
|
|
|
// If we've exhausted all address lines, move on to the next stage
|
|
|
|
// (and reset the pin counter to 0)
|
|
|
|
if (++addrDataPin > SIMM_HIGHEST_ADDRESS_LINE)
|
|
|
|
{
|
|
|
|
curStage++;
|
|
|
|
addrDataPin = 0;
|
|
|
|
}
|
|
|
|
}
|
|
|
|
else if (curStage == TestingDataLines)
|
|
|
|
{
|
|
|
|
// If we've exhausted all data lines, move on to the next stage
|
|
|
|
// (don't bother resetting the pin counter -- the other stages don't use it)
|
|
|
|
if (++addrDataPin > SIMM_HIGHEST_DATA_LINE)
|
|
|
|
{
|
|
|
|
curStage++;
|
|
|
|
}
|
|
|
|
}
|
|
|
|
else
|
|
|
|
{
|
|
|
|
curStage++;
|
|
|
|
}
|
|
|
|
|
|
|
|
// Move on to test the next pin
|
|
|
|
testPin++;
|
|
|
|
}
|
|
|
|
|
|
|
|
// Restore to a normal state by calling ParallelBus_Init again.
|
|
|
|
ParallelBus_Init();
|
|
|
|
|
|
|
|
// Now that the final state is restored, return the number of errors found
|
|
|
|
return numErrors;
|
|
|
|
}
|
|
|
|
|
|
|
|
/** Resets our list of pins that are shorted to ground
|
|
|
|
*
|
|
|
|
*/
|
|
|
|
static void SIMMElectricalTest_ResetGroundShorts(void)
|
|
|
|
{
|
|
|
|
groundShorts[0] = 0;
|
|
|
|
groundShorts[1] = 0;
|
|
|
|
}
|
|
|
|
|
|
|
|
/** Adds a pin to the list of ground shorts
|
|
|
|
*
|
|
|
|
* @param index The index of the pin in the electrical test
|
|
|
|
*/
|
|
|
|
static void SIMMElectricalTest_AddGroundShort(uint8_t index)
|
|
|
|
{
|
|
|
|
if (index < 32)
|
|
|
|
{
|
|
|
|
groundShorts[0] |= (1UL << index);
|
|
|
|
}
|
|
|
|
else if (index < 64)
|
|
|
|
{
|
|
|
|
groundShorts[1] |= (1UL << (index - 32));
|
|
|
|
}
|
|
|
|
// None are >= 64, no further handling needed
|
|
|
|
}
|
|
|
|
|
|
|
|
/** Determines if a pin has already been saved as a ground short
|
|
|
|
*
|
|
|
|
* @param index The index of the pin in the electrical test
|
|
|
|
* @return True if this pin has been determined as a short to GND, false if not
|
|
|
|
*/
|
|
|
|
static bool SIMMElectricalTest_IsGroundShort(uint8_t index)
|
|
|
|
{
|
|
|
|
if (index < 32)
|
|
|
|
{
|
|
|
|
return ((groundShorts[0] & (1UL << index)) != 0);
|
|
|
|
}
|
|
|
|
else if (index < 64)
|
|
|
|
{
|
|
|
|
return ((groundShorts[1] & (1UL << (index - 32))) != 0);
|
|
|
|
}
|
|
|
|
else
|
|
|
|
{
|
|
|
|
return false;
|
|
|
|
}
|
|
|
|
}
|