Optimized the SIMM electrical test, fixed a few small bugs I had introduced in the previous commit. Added comments where necessary. Seems to work great now.

This commit is contained in:
Doug Brown 2011-12-18 14:55:08 -08:00
parent a1ca591d60
commit e38269f879

View File

@ -43,6 +43,7 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
Ports_Init();
// Give everything a bit of time to settle down
DelayMS(DELAY_SETTLE_TIME_MS);
// First check for anything shorted to ground. Set all lines as inputs with a weak pull-up resistor.
@ -60,73 +61,80 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
DelayMS(DELAY_SETTLE_TIME_MS);
uint8_t testPinFailIndex;
uint8_t failIndex;
uint8_t curPin = 0;
uint8_t i;
// Read the address pins back first of all
uint32_t readback = Ports_ReadAddress();
if (readback != SIMM_ADDRESS_PINS_MASK)
{
failIndex = FIRST_ADDRESS_LINE_FAIL_INDEX;
// At this point, any errors will manifest as 0 bits. It's easier to test for errors by turning them
// into 1 bits, so invert the readback -- now, shorted pins are 1s and non-shorted pins are 0s
readback = ~readback & SIMM_ADDRESS_PINS_MASK;
// As long as there are any 1 bits, there is a short detected.
while (readback)
// Check each bit for a LOW which would indicate a short to ground
for (i = 0; i <= SIMM_HIGHEST_ADDRESS_LINE; i++)
{
if (readback & 1) // failure here?
// Did we find a low bit?
if (!(readback & 1))
{
errorHandler(failIndex, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(failIndex);
// That means this pin is shorted to ground.
// So notify the caller that we have a ground short on this pin
errorHandler(curPin, GROUND_FAIL_INDEX);
// Add it to our internal list of ground shorts also.
SIMMElectricalTest_AddGroundShort(curPin);
// And of course increment the error counter.
numErrors++;
}
// No matter what, though, move on to the next bit and pin.
readback >>= 1;
failIndex++;
curPin++;
}
}
// Repeat the exact same process for the data pins
readback = Ports_ReadData();
if (readback != SIMM_DATA_PINS_MASK)
{
failIndex = FIRST_DATA_LINE_FAIL_INDEX;
readback = ~readback;
while (readback)
for (i = 0; i <= SIMM_HIGHEST_DATA_LINE; i++)
{
if (readback & 1) // failure here?
if (!(readback & 1)) // failure here?
{
errorHandler(failIndex, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(failIndex);
errorHandler(curPin, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(curPin);
numErrors++;
}
readback >>= 1;
failIndex++;
curPin++;
}
}
// Check chip select in the same way...
if (!Ports_ReadCS())
{
errorHandler(CS_FAIL_INDEX, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(CS_FAIL_INDEX);
errorHandler(curPin, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(curPin);
numErrors++;
}
curPin++;
// Output enable...
if (!Ports_ReadOE())
{
errorHandler(OE_FAIL_INDEX, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(OE_FAIL_INDEX);
errorHandler(curPin, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(curPin);
numErrors++;
}
curPin++;
// Write enable...
if (!Ports_ReadWE())
{
errorHandler(WE_FAIL_INDEX, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(WE_FAIL_INDEX);
errorHandler(curPin, GROUND_FAIL_INDEX);
SIMMElectricalTest_AddGroundShort(curPin);
numErrors++;
}
curPin++; // Doesn't need to be here, but for consistency I'm leaving it.
// OK, now we know which lines are shorted to ground.
// We need to keep that in mind, because those lines will now show as shorted
@ -134,12 +142,10 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
// Now, check each individual line vs. all other lines on the SIMM for any shorts between them
ElectricalTestStage curStage = TestingAddressLines;
int x = 0;
// This is a counter we do once per pin. I use it to do a "triangle" algorithm so that I don't check
// every possible pair of pins twice. If I did, I would get two notifications for each short.
uint8_t pinsAlreadyChecked = 0;
uint8_t thisPin = 0;
uint8_t i;
int x = 0; // Counter of what address or data pin we're on. Not used for control lines.
uint8_t testPin = 0; // What pin we are currently testing all other pins against.
// x is only a counter inside the address or data pins.
// testPin is a total counter of ALL pins.
while (curStage != DoneTesting)
{
// Set one pin to output a 0.
@ -147,12 +153,11 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
// Then read back all the other pins. If any of them read back as 0,
// it means they are shorted to the pin we set as an output.
// This is the fail index of the pin we are outputting a 0 on.
testPinFailIndex = 0xFE; // Start with a default invalid value...will be replaced though.
// If we're testing address lines right now, set the current address line
// as an output (and make it output a LOW).
// Set all other address lines as inputs with pullups.
if (curStage == TestingAddressLines)
{
testPinFailIndex = FIRST_ADDRESS_LINE_FAIL_INDEX + x; // fail index of this address line
uint32_t addressLineMask = (1UL << x); // mask of the address pin we're testing
Ports_SetAddressDDR(addressLineMask); // set it as an output and all other address pins as inputs
@ -167,10 +172,9 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
Ports_AddressPullups_RMW(SIMM_ADDRESS_PINS_MASK, SIMM_ADDRESS_PINS_MASK);
}
// Do the same thing for data lines...
if (curStage == TestingDataLines)
{
testPinFailIndex = FIRST_DATA_LINE_FAIL_INDEX + x;
uint32_t dataLineMask = (1UL << x);
Ports_SetDataDDR(dataLineMask);
Ports_DataOut_RMW(0, dataLineMask);
@ -182,9 +186,9 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
Ports_DataPullups_RMW(SIMM_DATA_PINS_MASK, SIMM_DATA_PINS_MASK);
}
// Chip select...
if (curStage == TestingCS)
{
testPinFailIndex = CS_FAIL_INDEX;
Ports_SetCSDDR(true);
Ports_SetCSOut(false);
}
@ -194,9 +198,9 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
Ports_SetCSPullup(true);
}
// Output enable...
if (curStage == TestingOE)
{
testPinFailIndex = OE_FAIL_INDEX;
Ports_SetOEDDR(true);
Ports_SetOEOut(false);
}
@ -206,9 +210,9 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
Ports_SetOEPullup(true);
}
// And write enable.
if (curStage == TestingWE)
{
testPinFailIndex = WE_FAIL_INDEX;
Ports_SetWEDDR(true);
Ports_SetWEOut(false);
}
@ -221,101 +225,85 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
// OK, so now we have set up all lines as needed. Exactly one pin is outputting a 0, and all other pins
// are inputs with pull-ups enabled. Read back all the lines, and if any pin reads back as 0,
// it means that pin is shorted to the pin we are testing (overpowering its pullup)
// However, because we test each pin against every other pin, any short would appear twice.
// Once as "pin 1 is shorted to pin 2" and once as "pin 2 is shorted to pin 1". To avoid
// that annoyance, I only check each combination of two pins once. You'll see below
// how I do this by testing to ensure curPin > testPin.
DelayMS(DELAY_SETTLE_TIME_MS);
// Now keep a count of how many pins we have actually checked.
// We will skip the first "pinsAlreadyChecked" pins each time so we don't get duplicates.
thisPin = 0;
// Now keep a count of how many pins we have actually checked during THIS test.
curPin = 0;
// Read back the address data to see if any shorts were found
readback = Ports_ReadAddress();
if (curStage == TestingAddressLines)
{
// Insert a high bit so our test doesn't fail on the pin we were testing
readback |= (1UL << x);
}
failIndex = FIRST_ADDRESS_LINE_FAIL_INDEX;
// Count any shorted pins
for (i = 0; i <= SIMM_HIGHEST_ADDRESS_LINE; i++)
{
// failure here?
if ((thisPin >= pinsAlreadyChecked) && // We haven't already checked this combination of pins...
!(readback & 1) && // It's showing as a short...
!SIMMElectricalTest_IsGroundShort(failIndex)) // And it's not a short to ground
if ((curPin > testPin) && // We haven't already checked this combination of pins (don't test pin against itself either)
!(readback & 1) && // It's showing as low (which indicates a short)
!SIMMElectricalTest_IsGroundShort(curPin)) // And it's not recorded as a short to ground
{
errorHandler(testPinFailIndex, failIndex);
// Send it out as an error notification and increase error counter
errorHandler(testPin, curPin);
numErrors++;
}
// No matter what, move on to the next bit and pin
readback >>= 1;
failIndex++;
thisPin++;
curPin++;
}
// Same thing for data pins
readback = Ports_ReadData();
if (curStage == TestingDataLines)
{
// Insert a high bit so our test doesn't fail on the pin we were testing
readback |= (1UL << x);
}
failIndex = FIRST_DATA_LINE_FAIL_INDEX;
// Count any shorted pins
while (readback)
for (i = 0; i <= SIMM_HIGHEST_DATA_LINE; i++)
{
// failure here?
if ((thisPin >= pinsAlreadyChecked) && // We haven't already checked this combination of pins...
!(readback & 1) && // It's showing as a short...
!SIMMElectricalTest_IsGroundShort(failIndex)) // And it's not a short to ground
if ((curPin > testPin) && // We haven't already checked this combination of pins (don't test pin against itself either)
!(readback & 1) && // It's showing as low (which indicates a short)
!SIMMElectricalTest_IsGroundShort(curPin)) // And it's not recorded as a short to ground
{
errorHandler(testPinFailIndex, failIndex);
errorHandler(testPin, curPin);
numErrors++;
}
readback >>= 1;
failIndex++;
thisPin++;
curPin++;
}
if (curStage != TestingCS)
// And chip select...
if ((curPin > testPin) &&
!Ports_ReadCS() &&
!SIMMElectricalTest_IsGroundShort(curPin))
{
if ((thisPin >= pinsAlreadyChecked) &&
!Ports_ReadCS() &&
!SIMMElectricalTest_IsGroundShort(CS_FAIL_INDEX))
{
errorHandler(testPinFailIndex, CS_FAIL_INDEX);
numErrors++;
}
errorHandler(testPin, curPin);
numErrors++;
}
thisPin++;
curPin++;
if (curStage != TestingOE)
// Output enable...
if ((curPin > testPin) &&
!Ports_ReadOE() &&
!SIMMElectricalTest_IsGroundShort(curPin))
{
if ((thisPin >= pinsAlreadyChecked) &&
!Ports_ReadOE() &&
!SIMMElectricalTest_IsGroundShort(OE_FAIL_INDEX))
{
errorHandler(testPinFailIndex, OE_FAIL_INDEX);
numErrors++;
}
errorHandler(testPin, curPin);
numErrors++;
}
thisPin++;
curPin++;
if (curStage != TestingWE)
// And write enable
if ((curPin > testPin) &&
!Ports_ReadWE() &&
!SIMMElectricalTest_IsGroundShort(curPin))
{
if ((thisPin >= pinsAlreadyChecked) &&
!Ports_ReadWE() &&
!SIMMElectricalTest_IsGroundShort(WE_FAIL_INDEX))
{
errorHandler(testPinFailIndex, WE_FAIL_INDEX);
numErrors++;
}
errorHandler(testPin, curPin);
numErrors++;
}
thisPin++;
curPin++; // Not needed, kept for consistency
// Finally, move on to the next stage if needed.
if (curStage == TestingAddressLines)
@ -342,8 +330,8 @@ int SIMMElectricalTest_Run(void (*errorHandler)(uint8_t, uint8_t))
curStage++;
}
// Increase the number of pins we have actually checked...
pinsAlreadyChecked++;
// Move on to test the next pin
testPin++;
}
return numErrors;