[x86] Rip out some broken test cases for avx512 i1 store support.

It isn't reasonable to test storing things using undef pointers --
storing through those is at best "good luck" and really should be
transformed to "unreachable". Random changes in the combiner can
randomly break these tests for no good reason. I'm following up on the
original commit regarding the right long-term strategy here.

git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@213810 91177308-0d34-0410-b5e6-96231b3b80d8
This commit is contained in:
Chandler Carruth 2014-07-23 22:29:19 +00:00
parent ba08e46435
commit 1d73b6f8a6

View File

@ -152,32 +152,3 @@ define void @test18(i8 * %addr, <8 x i64> %data) {
store <8 x i64>%data, <8 x i64>* %vaddr, align 64
ret void
}
; CHECK-LABEL: store_i1_1
; CHECK: movb
; CHECK: movb
; CHECK: ret
define void @store_i1_1() {
store i1 true, i1 addrspace(3)* undef, align 128
store i1 false, i1 addrspace(2)* undef, align 128
ret void
}
; CHECK-LABEL: store_i1_2
; CHECK: movb
; CHECK: ret
define void @store_i1_2(i64 %a, i64 %b) {
%res = icmp eq i64 %a, %b
store i1 %res, i1 addrspace(3)* undef, align 128
ret void
}
; CHECK-LABEL: store_i1_3
; CHECK: kmovw
; CHECK: ret
define void @store_i1_3(i16 %a) {
%a_vec = bitcast i16 %a to <16 x i1>
%res = extractelement <16 x i1> %a_vec, i32 4
store i1 %res, i1 addrspace(3)* undef, align 128
ret void
}