Essentially the same as the GEP change in r230786.
A similar migration script can be used to update test cases, though a few more
test case improvements/changes were required this time around: (r229269-r229278)
import fileinput
import sys
import re
pat = re.compile(r"((?:=|:|^)\s*load (?:atomic )?(?:volatile )?(.*?))(| addrspace\(\d+\) *)\*($| *(?:%|@|null|undef|blockaddress|getelementptr|addrspacecast|bitcast|inttoptr|\[\[[a-zA-Z]|\{\{).*$)")
for line in sys.stdin:
sys.stdout.write(re.sub(pat, r"\1, \2\3*\4", line))
Reviewers: rafael, dexonsmith, grosser
Differential Revision: http://reviews.llvm.org/D7649
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@230794 91177308-0d34-0410-b5e6-96231b3b80d8
This changes the tests that were targeting ARM EABI to explicitly specify the
environment rather than relying on the default. This breaks with the new
Windows on ARM support when running the tests on Windows where the default
environment is no longer EABI.
Take the opportunity to avoid a pointless redirect (helps when trying to debug
with providing a command line invocation which can be copy and pasted) and
removing a few greps in favour of FileCheck.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@205541 91177308-0d34-0410-b5e6-96231b3b80d8
This update was done with the following bash script:
find test/CodeGen -name "*.ll" | \
while read NAME; do
echo "$NAME"
if ! grep -q "^; *RUN: *llc.*debug" $NAME; then
TEMP=`mktemp -t temp`
cp $NAME $TEMP
sed -n "s/^define [^@]*@\([A-Za-z0-9_]*\)(.*$/\1/p" < $NAME | \
while read FUNC; do
sed -i '' "s/;\(.*\)\([A-Za-z0-9_-]*\):\( *\)$FUNC: *\$/;\1\2-LABEL:\3$FUNC:/g" $TEMP
done
sed -i '' "s/;\(.*\)-LABEL-LABEL:/;\1-LABEL:/" $TEMP
sed -i '' "s/;\(.*\)-NEXT-LABEL:/;\1-NEXT:/" $TEMP
sed -i '' "s/;\(.*\)-NOT-LABEL:/;\1-NOT:/" $TEMP
sed -i '' "s/;\(.*\)-DAG-LABEL:/;\1-DAG:/" $TEMP
mv $TEMP $NAME
fi
done
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@186280 91177308-0d34-0410-b5e6-96231b3b80d8
the bits being cleared by the AND are not demanded by the BFI.
The previous BFI dag combine rule was actually incorrect (or used to be
correct until BFI representation changed).
rdar://9609030
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@133034 91177308-0d34-0410-b5e6-96231b3b80d8
legacy asm printer uses instructions of the form, "mov r0, r0, lsl #3", while
the MC-instruction printer uses the form "lsl r0, r0, #3". The latter mnemonic
is correct and preferred according the ARM documentation (A8.6.98). The former
are pseudo-instructions for the latter.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@114221 91177308-0d34-0410-b5e6-96231b3b80d8
instruction for non-constant operands. This includes the case referenced
in the README.txt regarding a bitfield copy.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@108608 91177308-0d34-0410-b5e6-96231b3b80d8
and a combine pattern to use it for setting a bit-field to a constant
value. More to come for non-constant stores.
git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@108570 91177308-0d34-0410-b5e6-96231b3b80d8
