This reverts commit r206683.
The code was confusing SEH register numbers with DWARF register numbers.
The test case it was committed with was obviously incorrect. The
disassembler was roundtripping '.seh_pushreg %rsi' as '.seh_pushreg
%rbp', and other exciting things.
Noticed by Vadim Chugunov.
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Summary:
Implement materialize of floating point literals in Mips Fast-Isel
Reopened version of D3659
Test Plan: simplestorefp1.ll
Reviewers: dsanders
Reviewed By: dsanders
Differential Revision: http://reviews.llvm.org/D4071
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This patch slightly changes the algorithm introduced at revision 210477
to fix a problem where the algorithm was producing incorrect code for
the VEX.256 encoded versions of horizontal add/sub.
For these cases, we now try to split the two 256-bit vectors into
128-bit chunks before emitting horizontal add/sub dag nodes.
Added a new test case into haddsub-2.ll.
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il is legal for Hexagon, so I should have marked this as Expand for
SELECT_CC when I removed setOperationAction(ISD::SELECT_CC, MVT::Other,
Expand); in r210541.
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Previously, the basic block was searched for future uses of the base register,
and if necessary any writeback to the base register was reset using a SUB
instruction (e.g. before calling a function) just before such a use. However,
this step happened *before* the merged LDM/STM instruction was built. So if
there was (e.g.) a function call directly after the not-yet-formed LDM/STM,
the pass would first insert a SUB instruction to reset the base register,
and then (at the same location, incorrectly) insert the LDM/STM itself.
This patch fixes PR19972. Patch by Moritz Roth.
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The SelectionDAG bad a special case for ISD::SELECT_CC, where it would
allow targets to specify:
setOperationAction(ISD::SELECT_CC, MVT::Other, Expand);
to indicate that they wanted to expand ISD::SELECT_CC for all types.
This wasn't applied correctly everywhere, and it makes writing new
DAG patterns with ISD::SELECT_CC difficult.
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Various masks on shufflevector instructions are recognizable as
specific PowerPC instructions (vector pack, vector merge, etc.).
There is existing code in PPCISelLowering.cpp to recognize the correct
patterns for big endian code. The masks for these instructions are
different for little endian code due to the big-endian numbering
employed by these instructions. This patch adds the recognition code
for little endian.
I've added a new test case test/CodeGen/PowerPC/vec_shuffle_le.ll for
this. The existing recognizer test (vec_shuffle.ll) is unnecessarily
verbose and difficult to read, so I felt it was better to add a new
test rather than modify the old one.
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Clang's lit cfg already detects the currently selected SDK via
"xcrun --show-sdk-path". The same thing should be done for compiler-rt tests,
to make them work on recent OS X versions. Instead of duplicating the detection
code, this patch extracts the detection function into a lit.util method.
Patch by Kuba Brecka (kuba.brecka@gmail.com),
reviewed at http://reviews.llvm.org/D4072
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inverted condition codes (CINC, CINV, CNEG, CSET, and CSETM).
Matching aliases based on "immediate classes", when disassembling,
wasn't previously supported, hence adding MCOperandPredicate
into class Operand, and implementing the support for it
in AsmWriterEmitter.
The parsing for those aliases was already custom, so just adding
the missing condition into AArch64AsmParser::parseCondCode.
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As Ana Pazos pointed out, these have to be restored to their incoming values
before a function returns; i.e. before the tail call. So they can't be used
correctly as the destination register.
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The C++ and C semantics of the compare_and_swap operations actually
require us to return a boolean "success" value. In LLVM terms this
means a second comparison of the output of "cmpxchg" against the input
desired value.
However, x86's "cmpxchg" instruction sets all flags for the comparison
formed, so we can skip any secondary comparison. (N.b. this isn't true
for cmpxchg8b/16b, which only set ZF).
rdar://problem/13201607
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Previously we were abandonning the attempt, leading to some combination of
extra work (when selection of a load/store fails completely) and inferior code
(when this leads to a real memcpy call instead of inlining).
rdar://problem/17187463
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We were hitting an assert if FastISel couldn't create the load or store we
requested. Currently this happens for large frame-local addresses, though
CodeGen could be improved there.
rdar://problem/17187463
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This improves the X86 cost model for small constants with large types. Before
this commit we would even hoist trivial constants such as i96 2.
This is related to <rdar://problem/17070936>
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never be true in a well-defined context. The checking for null pointers
has been moved into the caller logic so it does not rely on undefined behavior.
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Unfortunately there's no way to elegantly do this with pre-canned
algorithms. Using a generating iterator doesn't work because you default
construct for each element, then move construct into the actual slot
(bad for copy but non-movable types, and a little unneeded overhead even
in the move-only case), so just write it out manually.
This solution isn't exception safe (if one of the element's ctors calls
we don't fall back, destroy the constructed elements, and throw on -
which std::uninitialized_fill does do) but SmallVector (and LLVM) isn't
exception safe anyway.
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The code in PPCTargetLowering::PerformDAGCombine() that handles
unaligned Altivec vector loads generates a lvsl followed by a vperm.
As we've seen in numerous other places, the vperm instruction has a
big-endian bias, and this is fixed for little endian by complementing
the permute control vector and swapping the input operands. In this
case the lvsl is providing the permute control vector. Rather than
generating an lvsl and a complement operation, it is sufficient to
generate an lvsr instruction instead. Thus for LE code generation we
will generate an lvsr rather than an lvsl, and swap the other input
arguments on the vperm.
The existing test/CodeGen/PowerPC/vec_misalign.ll is updated to test
the code generation for PPC64 and PPC64LE, in addition to the existing
PPC32/G5 testing.
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