Apple-2-SW/a2audit
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a2audit/v0/index.md
Zellyn Hunter 215f4cb391 Skip RAMRD softswitch on <128K, broken emu check
2017-02-03 23:10:22 -05:00

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V0 Errors

E0001

The machine identification routines from http://www.1000bit.it/support/manuali/apple/technotes/misc/tn.misc.02.html failed to identify the model.

E0002

The current version of the audit program doesn't support the identified machine.

E0003

Soft-switched for either RAMRD or RAMWRT read as set, which means we're either reading from, or writing to, auxiliary RAM. Please press RESET and run the test again to start in a known-good state.

E0004

We tried to put the language card into read bank 1, write bank 1, but failed to write.

E0005

We tried to put the language card into read RAM, write RAM, but failed to write.

E0006

We tried to put the language card into read bank 2, write bank 2, but failed to write.

E0007

This is a data-driven test of Language Card operation. We initialize $D17B in RAM bank 1 to $11, $D17B in RAM bank 2 to $22, and $FE1F in RAM to $33. Then, we perform a testdata-driven sequence of LDA and STA to the $C08X range. Finally we (try to) increment $D17B and $FE1F. Then we test (a) the current live value in $D17B, (b) the current live value in $FE1F, (c) the RAM bank 1 value of $D17B, (d) the RAM bank 2 value of $D17B, and (e) the RAM value of $FE1F, to see whether they match expected values. $D17B is usually $53 in ROM, and $FE1F is usally $60. For more information on the operation of the language card soft-switches, see Understanding the Apple IIe, by James Fielding Sather, Pg 5-24.

E0008

We tried to run the langcard tests again with auxmem (ALTZP active), and they failed, so we're quitting the auxmem test.

E0009

We wrote $44 to main RAM in the three test locations used by the LC test. They should have been unaffected by the LC test while it was using auxmem, but at least one of them was modified.

E000A

This is a data-driven test of main and auxiliary memory softswitch operation. We initialize $FF, $100, $200, $3FF, $427, $7FF, $800, $1FFF, $2000, $3FFF, $4000, $5FFF, and $BFFF in main RAM to value 1, and in auxiliary RAM to value 3. Then, we perform a testdata-driven sequence of instructions. Finally we (try to) increment all test locations. Then we test the expected values of the test locations in main and auxiliary memory. For more information on the operation of the auxiliary memory soft-switches, see Understanding the Apple IIe, by James Fielding Sather, Pg 5-22 to 5-28.

E000B

This is a the Cxxx-ROM check part of the auxiliary memory data-driven test (see E000A for a description of the other part). After a full reset, we perform a testdata-driven sequence of instructions. Finally we check which parts of Cxxx ROM seem to be visible. We check C100-C2FF, C300-C3FF, C400-C7FF (which should be the same as C100-C2FF), and C800-CFFE. For more details, see Understanding the Apple IIe, by James Fielding Sather, Pg 5-28.

E000C

$400 main memory and $300 aux memory seem to write to the same place, which is probably an emulator bug.